Joel Fabrice Leclair

Paris-Saclay, France

Research Interests


Ph.D. Materials Science - University P&M Curie Paris (1984)

Selected articles and publications

Determination of the angle of incidence in a Cameca IMS-4f SIMS instrument
Surface and Interface Analysis
Volume 14, Issue 11, November 1989, Pages: 739–743
M. Meuris, P. De Bisschop, J. F. Leclair and W. Vandervorst - (IMEC)

Oxygen redistribution in silicon during zone melting recrystallization
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 45, Issues 1–4, 2 January 1990, Pages 586–591
P.W. Mertens, W. Vandervorst, J. Leclair - (IMEC)

Oxygen distribution in silicon‐on‐insulator layers obtained by zone melting recrystallization
J. Appl. Phys. 67, 7337 (1990)
P. W. Mertens, J. Leclair, H. E. Maes and W. Vandervorst - (IMEC)

Failure Analysis of Laser Emission Modules
Société des Electriciens et Electroniciens de France
3ème Atelier Techniques d'analyse de défaillance des composants - Aussois 1992
J.F. Leclair, C. Alliaume - Alcatel CIT